Quality Control and Certificates
CoreStaff Co.,Ltd. only sells products that meet the strict quality standards of our "Analysis Center", a facility specializing in testing items from our inventory
Products procured from sources outside authorized channels carry the risk of being counterfeit or deteriorating over time
At CoreStaff, we have a wide range of equipment, including transmission X-rays, fluorescent X-rays, microscopes, and even curve tracers that can perform IV characteristic inspections.
We also have IC package opening equipment, so we can also inspect the internal chips in-house.
コアスタッフ オンラインよりご購入頂いたすべての製品には、1年間の保証期間を付与します。
- コアスタッフ オンラインからご購入頂いた製品は、運営会社であるコアスタッフ株式会社が品質保証を行います。
- 万が一、ご購入いただいた製品に不具合が発生した場合、交換部品の手配、または返金処理をいたします。
ご希望のお客様には無償で 対象製品の「不具合解析」を行い*、レポートを提出いたします。
詳細は営業担当へご相談ください。
- この場合の解析内容は、①外観検査、②X線検査、③I-V検査、④開封検査の4項目を実施いたします。
ただし、製品種類によっては解析を行うことができない場合がございますため、その場合は交換部品の手配または返金のみ対応、
もしくは別の方法による不具合解析（有償）のご提案とさせていただきます。 - Please note that we cannot accept returns simply because the manufacturer cannot confirm the shipping history.
- 不具合発生時には、どのような現象・症状が発生しているか詳細をメールもしくは書面にてご連絡ください。
メーカーで出荷履歴の確認が取れないという理由だけでは返品はお受けできませんので、ご了承ください。
- 解析の結果、製品に異常がない場合やお客様の使用環境が原因による故障の場合は解析に関わる費用を請求させていただく場合が
ございます。良品、不良品の切り分けを確実に行ったうえでご依頼くださいますよう、お願いいたします。 - 一部返品対象外のものもございます。
- Supplier ranks C-1 and C-2 are guaranteed for 365 days if they can provide samples of good quality and pass the inspection by an external inspection agency, and if they do not have samples of good quality or do not conduct an inspection by an external inspection agency, the supplier guarantees. According to the period.
- 本保証はエンドユーザー様への保証内容です。同業の会社様へは自社在庫のみ1年間の保証、その他の仕入在庫については1ヶ月間の保証期間となり不具合解析には対応しておりません。
- The warranty is limited to the product price.
Testing equipment used by CoreStaff Co., Ltd.
Micro-Scope 245 magnifications （Keyence :VH-5000）
透過型X線検査装置
リール対応
透過型X線検査装置
Curve Tracer
Thermostatic Tank（ESPEC）
X-Ray Fluorescence Analyzer
IC Decapping Machine
LCR Meter
Solder Pot
Analytical Balance
Thermal Desorption MS
リフロー装置
Supplier Ranks and Testing Methods
Supplier
|
Overview | Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
|---|---|---|---|---|---|---|
A-1
|
Stock from authorized distributor or directly from the MFR.
Failure analysis* and other related documents* can be issued from authorized supplier or the MFR upon request. (*Needs to be confirmed) |
○ | ＊ | ＊ | ＊ | ＊ |
A-1
|
海外の正規代理店。メーカーによる不良解析、有害物質等のドキュメント対応が可能だが、メーカーにより一部対応不可の場合がある | ○ | ＊ | ＊ | ＊ | ＊ |
A-2 |
Stock from authorized distributor or directly from the MFR. Failure analysis and other related documents CANNOT be arranged. |
○ | ＊ | ＊ | ＊ | ＊ |
A-3 |
Excess inventory purchased through authorized channels,
securely stored at OEM or CM warehouses and quality-assured by CoreStaff. Should any issues arise, we will cover the cost for failure analysis through our partnered test house. |
○ | △ | △ | ＊ | ＊ |
A-4 |
CoreStaff’s own stock. EMS, OEM, MFR and/or distributor excess stock. Includes but not limited to Japanese OEM consignment stock. Quality and availability guaranteed by CoreStaff. |
○ | ＊ | ＊ | ＊ | ＊ |
B-1 |
Supplier’s own stock; EMS, OEM or MFR excess stock. Reliable supplier, who’s been doing business with CoreStaff for many years. |
○ | △ | △ | ＊ | ＊ |
B-2 |
Supplier’s partner stock; not their own stock. Reliable supplier, who has been doing business with CoreStaff for many years |
○ | △ | △ | ＊ | ＊ |
C-1 |
Supplier’s own stock. Secondary supplier with less transaction history.
|
○ | △ | ◯ | △ | ＊ |
C-2 |
Supplier’s partner stock; not their own stock.
Secondary supplier with less transaction history. |
○ | △ | ◯ | △ | ＊ |
A-1 |
||||
|---|---|---|---|---|
| Overview | ||||
| Stock from authorized distributor or directly from the MFR.
Failure analysis* and other related documents* can be issued from authorized supplier or the MFR upon request. (*Needs to be confirmed) |
||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | ＊ | ＊ | ＊ | ＊ |
A-1 |
||||
|---|---|---|---|---|
| Overview | ||||
| 海外の正規代理店。メーカーによる不良解析、有害物質等のドキュメント対応が可能だが、メーカーにより一部対応不可の場合がある | ||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | ＊ | ＊ | ＊ | ＊ |
A-2 |
||||
|---|---|---|---|---|
| Overview | ||||
| Stock from authorized distributor or directly from the MFR. Failure analysis and other related documents CANNOT be arranged. |
||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | ＊ | ＊ | ＊ | ＊ |
A-3 |
||||
|---|---|---|---|---|
| Overview | ||||
| A secondary store with higher prices. We have our own inventory through regular channels. |
||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | ＊ | ＊ | ＊ | ＊ |
A-4 |
||||
|---|---|---|---|---|
| Overview | ||||
| CoreStaff’s own stock. EMS, OEM, MFR and/or distributor excess stock. Includes but not limited to Japanese OEM consignment stock. Quality and availability guaranteed by CoreStaff. |
||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | ＊ | ＊ | ＊ | ＊ |
B-1 |
||||
|---|---|---|---|---|
| Overview | ||||
| Supplier’s own stock; EMS, OEM or MFR excess stock. Reliable supplier, who’s been doing business with CoreStaff for many years. |
||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | △ | △ | ＊ | ＊ |
B-2 |
||||
|---|---|---|---|---|
| Overview | ||||
| Supplier’s partner stock; not their own stock. Reliable supplier, who has been doing business with CoreStaff for many years |
||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | △ | △ | ＊ | ＊ |
C-1 |
||||
|---|---|---|---|---|
| Overview | ||||
| Supplier’s own stock. Secondary supplier with less transaction history.
|
||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | △ | ◯ | △ | ＊ |
C-2 |
||||
|---|---|---|---|---|
| Overview | ||||
| Supplier’s partner stock; not their own stock.
Secondary supplier with less transaction history. |
||||
| Visual Inspection | micro scope |
X-Ray | Curve Tracer (IV characteristics) |
IC Tester (Function) |
| ○ | △ | ◯ | △ | ＊ |
○…Sampling performed △…Sampling is perfomed on a case-by-case basis *…Typically not performed, but available upon request for a fee.
*The number of samples will be determined according to company regulations.
[Inspection Process] Thorough examination conducted through three-step evaluation.
Key Inspection Areas and Precautionary Measures
| Inspection Criteria | Overview | Method of Examination | Example Image |
|---|---|---|---|
| Lead Oxidation/Corrosion | Examination via Microscope |
 Visual  microscope |
See photo
|
| Contamination with used parts | Examination via Microscope |
Visual micro scope |
See photo
|
| Inclusion of pre-programmed units | Examination via Microscope |
Visual micro scope |
See photo
|
| Infiltration of counterfeit products | Microscopic examination to assess the seal and package surface structure. X-ray confirmation of lead structure, wire arrangement/shape, and chip shape. |
Visual micro scope  X-Ray  Oscilloscope  I Ctester |
See photo
|
| Internal Corrosion of Chip | Opening package to assess contents |
Visual micro scope |
See photo
|
| Lead Oxidation/Corrosion |
|---|
| Examination via Microscope |
| Method of Examination |
|
Visual micro scope |
| Example Image |
|
See photo
|
| Contamination with used parts |
|---|
| Examination via Microscope |
| Method of Examination |
|
Visual micro scope |
| Example Image |
|
See photo
|
| Inclusion of pre-programmed units |
|---|
| Examination via Microscope |
| Method of Examination |
|
Visual micro scope |
| Example Image |
|
See photo
|
| Infiltration of counterfeit products |
|---|
| Microscopic examination to assess the seal and package surface structure. X-ray confirmation of lead structure, wire arrangement/shape, and chip shape. |
| Method of Examination |
|
Visual micro scope X-Ray Oscilloscope I Ctester |
| Example Image |
|
See photo
|
| Internal Corrosion of Chip |
|---|
| Opening package to assess contents |
| Method of Examination |
|
Visual micro scope |
| Example Image |
|
See photo
|
